Single-event upset
CHANGE OF STATE CAUSED BY ONE SINGLE IONIZING PARTICLE (IONS, ELECTRONS, PHOTONS...) STRIKING A SENSITIVE NODE IN A MICRO-ELECTRONIC DEVICE, SUCH AS IN A MICROPROCESSOR, SEMICONDUCTOR MEMORY, OR POWER TRANSISTORS
Single event upsets; Single-event upsets; Single event upset; Single event effects
A single-event upset (SEU), also known as a single-event error (SEE), is a change of state caused by one single ionizing particle (ions, electrons, photons...) striking a sensitive node in a micro-electronic device, such as in a microprocessor, semiconductor memory, or power transistors.